主要论文 |
[1] Peng Liu, Zhiqiang You, Jigang Wu, Michael Elimu, Weizheng Wang, Shuo Cai and Yinhe Han, Defect Analysis and Parallel Testing for 3D Hybrid CMOS-Memristor Memory, IEEE Transactions on Emerging Topics in Computing, 9(2), 2021, pp. 745-758. [2] Peng Liu, Zhiqiang You, Jigang Wu, Bosheng Liu, Yinhe Han, and Krishnendu Chakrabarty, Fault Modeling and Efficient Testing of Memristor-based Memory, IEEE Transactions on Circuits and Systems I: Regular Paper, 68(2), 2021, pp.4444-4455. [3] Peng Liu, Hongxian Chen, Weihao Ni, Fan Li, Faster-Than-Nyquist 400G Implementation Using 126-Gbaud QPSK-OFDM With 88-GSa/s Undersampling, Frontiers in Physics, 9, 2021, pp. 1-7. [4] Yi Zhao, Hui Chen*, Peng Liu*, Jigang Wu, Dongxiang Luo, An improved reconfigurable logic in resistive random access memory, Integration, the VLSI Journal, 87, 2022, pp. 169-175. [5] Qingxiao Guan, Peng Liu*, Weiming Zhang, Wei Lu, Xinpeng Zhang, Double-Layered Dual-Syndrome Trellis Codes Utilizing Channel Knowledge for Robust Steganography, IEEE TRANSACTIONS ON INFORMATION FORENSICS AND SECURITY, 18, 2023, pp.501-516. [6] Zhen Wang, Guofa Zhang, Peng Liu*, Jing Ye, Jianhui Jiang, Accurate Reliability Boundary Evaluation of Approximate Arithmetic Circuit, IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 30(10), 2022 pp. 1507-1518. [7] Lian Yao, Peng Liu*, Jigang Wu*, Yinhe Han, Yuehang Zhong and Zhiqiang You, Integrating Two Logics into One Crossbar Array for Logic Gate Design, IEEE Transactions on Circuits and Systems II: Express Briefs, 68(8), 2021, pp. 2987-2991. [8] Peng Liu, Jigang Wu, Zhiqiang You, Michael Elimu, Weizheng Wang and Shuo Cai, “Defect Analysis and Parallel March Algorithm for 3D Hybrid CMOS-Memristor Memory”, IEEE 27th Asian Test Symposium, pp.25-29, 2018. (CCF C类会议) [9] Peng Liu, Zhiqiang You, Jishun Kuang, Michael Elimu, Shuo Cai and Weizheng Wang, “Logic Operation-based DFT Method and Parallel Test Algorithm for 1T1R Crossbar”, Electronics Letters, Vol. 53, No. 25, pp. 1631-1632, 2017. [10] Peng Liu, Zhiqiang You, Jishun Kuang, Zhipeng Hu, Heng Duan and Weizheng Wang, “Efficient March Test Algorithm for 1T1R Crossbar with Complete Fault Coverage”, Electronics Letters, Vol. 52, No. 18, 1520-1522, 2016. |